Author: Su Z. Timmermans W. Gieske A. Jia L. Elbers J. A. Olioso A. Timmermans J. Van Der Velde R. Jin X. Van Der Kwast H. Nerry F. Sabol D. Sobrino J. A. Moreno J. Bianchi R.
Publisher: Taylor & Francis Ltd
ISSN: 1366-5901
Source: International Journal of Remote Sensing, Vol.29, Iss.17-18, 2008-01, pp. : 5215-5235
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
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