Monitoring soybean growth using L-, C-, and X-band scatterometer data

Author: Kim Yihyun   Jackson Thomas   Bindlish Rajat   Lee Hoonyol   Hong Sukyoung  

Publisher: Taylor & Francis Ltd

ISSN: 1366-5901

Source: International Journal of Remote Sensing, Vol.34, Iss.11, 2013-06, pp. : 4069-4082

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Abstract