Surface microcharacterization of silicon wafers by the light-beam-induced current technique in the planar configuration and by attenuated total reflection spectroscopy

Author： Spadoni S.   Acciarri M.   Narducci D.   Pizzini S.  

Publisher： Taylor & Francis Ltd

ISSN： 1463-6417

Source： Philosophical Magazine B, Vol.80, Iss.4, 2000-04, pp. : 579-585

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Evaluation of light scattering in attenuated total reflection configuration

By Pichlmaier Stephan   Hehl Karl   Arnold Michael  

Waves in Random Media, Vol. 6, Iss. 3, 1996-07 ,pp. : 269-280

Taylor & Francis Ltd

Access to resources Recommend Favorite

Depth profiling of porous silicon layers by attenuated total reflection spectroscopy

By Theisz W.   Wernke M.   Offermann V.  

Thin Solid Films, Vol. 255, Iss. 1, 1995-01 ,pp. : 181-184

Elsevier

Access to resources Recommend Favorite

Second harmonic generation of light in the Kretschmann attenuated total reflection geometry in the presence of surface roughness

By I.V. Novikov  

Waves in Random Media, Vol. 11, Iss. 3, 2001-03 ,pp. : 183-231

Taylor & Francis Ltd

Access to resources Recommend Favorite

Attenuated total reflection spectroscopy of Ag-SiO 2 composite films

By Kume T.   Amano T.   Hayashi S.   Yamamoto K.  

Thin Solid Films, Vol. 264, Iss. 1, 1995-08 ,pp. : 115-119

Elsevier

Access to resources Recommend Favorite

In Situ Infrared Attenuated Total Reflection (IR ATR) Spectroscopy: A Complementary Analytical Tool for Drug Design and Drug Delivery

By Fringeli Urs Peter  

CHIMIA International Journal for Chemistry, Vol. 46, Iss. 5, 1992-05 ,pp. : 200-214

Swiss Chemical Society

Access to resources Recommend Favorite