Transmission electron microscopy analysis of planar faults on (001) planes in MoSi 2 single crystals

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Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 82, Iss. 14, 2002-09 ,pp. : 2737-2754

Taylor & Francis Ltd

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Accurate measurement of atomic segregation to grain boundaries or to planar faults by analytical transmission electron microscopy

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PHYSICA STATUS SOLIDI (C) - CURRENT TOPICS IN SOLID STATE PHYSICS, Vol. 12, Iss. 3, 2015-03 ,pp. : 310-313

John Wiley & Sons Inc

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Microstructural study of long-range-ordered phase delta'-TiN 0.5 by transmission electron microscopy

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Transmission electron microscopy study of dislocations and extended defects in as-grown icosahedral Al-Pd-Mn single grains

By Caillard D.   Vanderschaeve G.   Bresson L.   Gratias D.  

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Transmission electron microscopy and X-ray diffraction study of T 1 and Omega precipitates in Al-Li alloys

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