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Springer Publishing Company

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Dopant compensation mechanism and leakage current in Pb(Zr 0.52 ,Ti 0.48 )O 3 thin films

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Optical properties of amorphous PbZr x Ti 1-x O 3 (x=0.52) thin films prepared by RF magnetron sputtering

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Far-infrared conductivity of the PbZr 0.52 Ti 0 . 48 O 3 and Cu-doped PbTiO 3 ferroelectric thin films

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