Sensitivity Based Statistical Analysis of Circuit Parameters Obtained From a Quasi-Tem Analysis of Multiconductor Transmission Lines

Author: Laermans E.   Olyslager F.   Zutter D.  

Publisher: Taylor & Francis Ltd

ISSN: 1569-3937

Source: Journal of Electromagnetic Waves and Applications, Vol.11, Iss.11, 1997-01, pp. : 1483-1508

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Abstract