A Study about a Method Joining the Admittance Matrix and the Data of Far Field

Author： OuYang J.   Yang F.   Yang S. W.   Nie Z. P.   Zhi Z. Q.  

Publisher： Taylor & Francis Ltd

ISSN： 1569-3937

Source： Journal of Electromagnetic Waves and Applications, Vol.21, Iss.15, 2007-12, pp. : 2395-2402

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