Analysis of EMP Coupling to a Device from A Wire Penetrating a Cavity Aperture Using Transient Electromagnetic Topology

Author: Xie H.   Wang J.   Sun D.   Fan R.   Liu Y.  

Publisher: Taylor & Francis Ltd

ISSN: 1569-3937

Source: Journal of Electromagnetic Waves and Applications, Vol.23, Iss.17-18, 2009-12, pp. : 2313-2322

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Abstract