A quick estimation of the LEED pattern size formed by an electrostatic objective lens in LEEM

Author: Kan H-C.   Phaneuf R.J.  

Publisher: Urban & Fischer

ISSN: 0030-4026

Source: Optik – International Journal for Light and Electron Optics, Vol.112, Iss.11, 2002-01, pp. : 511-514

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Abstract