Author: Saraç Zehra Groß Reinhard Richter Claus Wiesner Bernhard Häusler Gerd
Publisher: Urban & Fischer
ISSN: 0030-4026
Source: Optik – International Journal for Light and Electron Optics, Vol.115, Iss.8, 2004-10, pp. : 351-357
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
White-light interferometry with depolarization of the radiation
Technical Physics Letters, Vol. 23, Iss. 7, 1997-07 ,pp. :
White-light interferometry with an extended zoom range
By Windecker R. Fleischer M. Tiziani H. J.
Journal of Modern Optics, Vol. 46, Iss. 7, 1999-06 ,pp. :
An algorithm for profilometry by white light phase shifting interferometry
Journal of Modern Optics, Vol. 43, Iss. 8, 1996-08 ,pp. :
A micro-displacement stage for scanning white-light interferometry
Journal of Physics: Conference Series , Vol. 13, Iss. 1, 2005-01 ,pp. :
Diffusion of light transmitted from rough surfaces
By Quintian F. Perez Rebollo M. A. Gaggioli N. G.
Journal of Modern Optics, Vol. 44, Iss. 3, 1997-03 ,pp. :