Determination of the free carrier concentration in atomic-layer doped germanium thin films by infrared spectroscopy

Author： Calandrini Eugenio Ortolani Michele Nucara Alessandro Scappucci Giordano Klesse Wolfgang M Simmons Michelle Y Sabbagh Diego Capellini Giovanni Virgilio Michele Baldassarre Leonetta

Publisher： IOP Publishing

ISSN： 2040-8986

Source： Journal of Optics, Vol.16, Iss.9, 2014-09, pp. : 94010-94016

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