High speed friction microscopy and nanoscale friction coefficient mapping

Author： Bosse James L   Lee Sungjun   Andersen Andreas Sø   Sutherland Duncan S   Huey Bryan D  

Publisher： IOP Publishing

ISSN： 0957-0233

Source： Measurement Science and Technology, Vol.25, Iss.11, 2014-11, pp. : 115401-115409

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