Author: Zhiming Li Hailing Li Xiaobing Gan Haiying Jiang Jinping Li Xiaoqian Fu Yanbin Han Yingjie Xia Jianqin Yin Yimei Huang Shigang Hu
Publisher: IOP Publishing
ISSN: 1674-4926
Source: Journal of Semiconductors, Vol.35, Iss.9, 2014-09, pp. : 92003-92007
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