Author: Ryu Bengso Tawfik Wael Z Bae Seo-Jung Ryu Sang-Wan
Publisher: IOP Publishing
ISSN: 0022-3727
Source: Journal of Physics D: Applied Physics, Vol.46, Iss.43, 2013-10, pp. : 435103-435108
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
Reliability study on green InGaN/GaN light emitting diodes
Journal of Physics: Conference Series , Vol. 209, Iss. 1, 2010-02 ,pp. :