Deep-ultraviolet Raman investigation of silicon oxide: thin film on silicon substrate versus bulk material

Publisher: IOP Publishing

ISSN: 2043-6262

Source: Advances in Natural Sciences: Nanoscience and Nanotechnology, Vol.3, Iss.4, 2012-12, pp. : 22-28

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract