Publisher: IOP Publishing
ISSN: 1468-6996
Source: Science and Technology of Advanced Materials, Vol.6, Iss.2, 2005-03, pp. : 47-55
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Surface gradient integrated profiler for X-ray and EUV optics
Science and Technology of Advanced Materials, Vol. 8, Iss. 3, 2007-04 ,pp. :
HREM alignment aided by a real-time diffractometer using a liquid-crystal panel
Ultramicroscopy, Vol. 60, Iss. 1, 1995-08 ,pp. :