Magnetic exchange force microscopy from first principles: application to the antiferromagnetic NiO(001) surface

Publisher: IOP Publishing

ISSN: 1367-2630

Source: New Journal of Physics, Vol.16, Iss.2, 2014-02, pp. : 316-333

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract