a-SiCxNy thin films deposited by a microwave plasma assisted CVD process using a CH4/N2/Ar/HMDSN mixture: Methane rate effect

Publisher: IOP Publishing

ISSN: 1757-899X

Source: IOP Conference Series: Materials Science and Engineering, Vol.12, Iss.1, 2010-06, pp. : 8-11

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Abstract