Accurate measurement of RF exposure from emerging wireless communication systems

Publisher: IOP Publishing

ISSN: 1757-899X

Source: IOP Conference Series: Materials Science and Engineering, Vol.44, Iss.1, 2013-04, pp. : 59-62

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract