Deflectometry for secure traceability

ISSN： 1742-6596

Source： Journal of Physics: Conference Series , Vol.139, Iss.1, 2008-11, pp. : 144-149

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Analysis Traceability and Provenance for HEP

Journal of Physics: Conference Series , Vol. 664, Iss. 3, 2015-12 ,pp. : 188-195

IOP Publishing

Access to resources Recommend Favorite

Use of a phase type elongated circular grating in Talbot moiré deflectometry

By Kim B J Yuk K C Lee S I Chang S

Optik – International Journal for Light and Electron Optics, Vol. 115, Iss. 3, 2004-06 ,pp. : 121-128

Urban & Fischer

Access to resources Recommend Favorite

Temperature Measurement in Small-Scale Flows with Digital Moire Deflectometry

By Juste G. L. Benavides E. M.

Experimental Heat Transfer, Vol. 24, Iss. 3, 2011-07 ,pp. : 201-214

Taylor & Francis Ltd

Access to resources Recommend Favorite

Distance Calibration between Reference Plane and Screen in Direct Phase Measuring Deflectometry

By Huang Shujun Liu Yue Gao Nan Zhang Zonghua Gao Feng Jiang Xiangqian

Sensors, Vol. 18, Iss. 1, 2018-01 ,pp. : 144-144

MDPI

Access to resources Recommend Favorite

Glance traceability – Web system for equipment traceability and radiation monitoring for the ATLAS experiment

Journal of Physics: Conference Series , Vol. 219, Iss. 4, 2010-04 ,pp. : 354-360

IOP Publishing

Access to resources Recommend Favorite