Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.100, Iss.1, 2008-03, pp. : 144-147
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Temperature effect on low-k dielectric thin films studied by ERDA
Journal of Physics: Conference Series , Vol. 100, Iss. 1, 2008-03 ,pp. :
Study of High-k Dielectric Insulation Layers for Organic TFT and Characteristics of TFT
By Park S.
Ferroelectrics, Vol. 328, Iss. 1, 2005-01 ,pp. :