Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.26, Iss.1, 2006-02, pp. : 347-350
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Intermetallic Texture Analysis by X-Ray, Neutron and Electron Backscattered Diffraction
Le Journal de Physique IV, Vol. 06, Iss. C2, 1996-03 ,pp. :
Electron energy loss and diffraction of backscattered electrons from silicon
New Journal of Physics, Vol. 12, Iss. 5, 2010-05 ,pp. :
Polyatomic molecular structure retrieval using laser-induced electron diffraction
Journal of Physics: Conference Series , Vol. 635, Iss. 7, 2015-09 ,pp. :