Detection of nano-particles by dynamic dislocation-defect analysis

ISSN： 1742-6596

Source： Journal of Physics: Conference Series , Vol.240, Iss.1, 2010-07, pp. : 143-147

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

DISLOCATION DEFECT STATES IN SILICON

Le Journal de Physique Colloques, Vol. 40, Iss. C6, 1979-06 ,pp. : C6-67-C6-70

Edp Sciences

Access to resources Recommend Favorite

Non Destructive Defect Detection by Spectral Density Analysis

By Krejcar Ondrej Frischer Robert

Sensors, Vol. 11, Iss. 3, 2011-02 ,pp. : 2334-2346

MDPI

Access to resources Recommend Favorite

Experimental study on structural defect detection by monitoring distributed dynamic strain

By Liu R M Babanajad S K Taylor T Ansari F

Smart Materials and Structures, Vol. 24, Iss. 11, 2015-11 ,pp. : 115038-115045

IOP Publishing

Access to resources Recommend Favorite

Low-electron fluence STEM-EELS analysis of ferrihydrite nano-particles approaching the Ångstrom scale

Journal of Physics: Conference Series , Vol. 241, Iss. 1, 2010-07 ,pp. : 219-222

IOP Publishing

Access to resources Recommend Favorite

DYNAMIC DISLOCATION DAMPING IN METALS

Le Journal de Physique Colloques, Vol. 42, Iss. C5, 1981-10 ,pp. : C5-345-C5-350

Edp Sciences

Access to resources Recommend Favorite