Evaluation of the substitutional carbon content in annealed Si/SiGeC superlattices by dark-field electron holography

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Journal of Physics: Conference Series , Vol. 326, Iss. 1, 2011-11 ,pp. : 165-168

IOP Publishing

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Strain measurement for the semiconductor industry with nm-scale resolution by dark field electron holography and nanobeam electron diffraction

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Journal of Physics: Conference Series , Vol. 326, Iss. 1, 2011-11 ,pp. : 169-172

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Detection and study of magnetic micro-and nanostructures using dark-field optical microscopy

By Belotelov V.   Logginov A.   Nikolaev A.  

Physics of the Solid State, Vol. 45, Iss. 3, 2003-03 ,pp. : 519-528

MAIK Nauka/Interperiodica

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EUV microscopy for defect inspection by dark-field mapping and zone plate zooming

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Journal of Physics: Conference Series , Vol. 186, Iss. 1, 2009-09 ,pp. : 100-102

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Weak-beam dark-field electron tomography of dislocations in GaN

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Journal of Physics: Conference Series , Vol. 26, Iss. 1, 2006-02 ,pp. : 247-250

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