Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.499, Iss.1, 2014-04, pp. : 62-64
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Subjective and objective depth-of-focus
By Vasudevan Balamurali Ciuffreda Kenneth J. Wang Bin
Journal of Modern Optics, Vol. 54, Iss. 9, 2007-06 ,pp. :
Development of EUV light source by laser-produced plasma
Le Journal de Physique IV, Vol. 133, Iss. issue, 2006-06 ,pp. :
Characterization of nano-structured surfaces by EUV scatterometry
Journal of Physics: Conference Series , Vol. 311, Iss. 1, 2011-08 ,pp. :
Carbamic acid produced by the UV/EUV irradiation of interstellar ice analogs
Astronomy & Astrophysics, Vol. 464, Iss. 1, 2007-03 ,pp. :