Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.502, Iss.1, 2014-04, pp. : 44-47
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Scanning transmission X-ray microscopy with a segmenteddetector
Le Journal de Physique IV, Vol. 104, Iss. issue, 2003-03 ,pp. :
Development of soft X-ray microscopy System using X-ray laserin JAERI Kansai
Le Journal de Physique IV, Vol. 104, Iss. issue, 2003-03 ,pp. :