Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.522, Iss.1, 2014-06, pp. : 207-210
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Can direct electron detectors outperform phosphor-CCD systems for TEM?
Journal of Physics: Conference Series , Vol. 126, Iss. 1, 2008-08 ,pp. :
Direct detectors for the Einstein inflation probe
Journal of Physics: Conference Series , Vol. 155, Iss. 1, 2009-03 ,pp. :
Scanning transmission electron microscopy
Le Journal de Physique IV, Vol. 03, Iss. C7, 1993-11 ,pp. :