Intact sublimation of silicon nanocrystals evidenced via HREM imaging and EELS in a dedicated STEM

ISSN： 1742-6596

Source： Journal of Physics: Conference Series , Vol.126, Iss.1, 2008-08, pp. : 270-273

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Structural and compositional study of Erbium-doped silicon nanocrystals by HAADF, EELS and HRTEM techniques in an aberration corrected STEM

Journal of Physics: Conference Series , Vol. 209, Iss. 1, 2010-02 ,pp. : 242-245

IOP Publishing

Access to resources Recommend Favorite

Atomic-resolution STEM imaging and EELS-SI of defects in BiFeO3 ceramics co-doped with Nd and Ti

Journal of Physics: Conference Series , Vol. 371, Iss. 1, 2012-07 ,pp. : 137-140

IOP Publishing

Access to resources Recommend Favorite

Sublimation epitaxy of cubic silicon carbide in vacuum

Journal of Physics: Conference Series , Vol. 223, Iss. 1, 2010-04 ,pp. : 64-67

IOP Publishing

Access to resources Recommend Favorite

Characterisation of Grain Boundaries in CaCu3Ti4O12 using HREM, EDS and EELS

Journal of Physics: Conference Series , Vol. 26, Iss. 1, 2006-02 ,pp. : 65-68

IOP Publishing

Access to resources Recommend Favorite

STEM-EELS investigations of high-k dielectrics

Journal of Physics: Conference Series , Vol. 209, Iss. 1, 2010-02 ,pp. : 76-85

IOP Publishing

Access to resources Recommend Favorite