Publisher： IOP Publishing
ISSN： 1742-6596
Source： Journal of Physics: Conference Series , Vol.186, Iss.1, 2009-09, pp. : 25-27
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Phase contrast X-ray microscopy at 4 keV photon energywith 60 nm resolution
Le Journal de Physique IV, Vol. 104, Iss. issue, 2003-03 ,pp. :
Access to resources
Recommend
HIGH RESOLUTION X-RAY MICROSCOPY WITH ZONE PLATE MICROSCOPES
Le Journal de Physique Colloques, Vol. 45, Iss. C2, 1984-02 ,pp. :
Zernike phase-contrast X-ray microscope with an X-ray refractivelens
Le Journal de Physique IV, Vol. 104, Iss. issue, 2003-03 ,pp. :
Access to resources
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, Vol. 4, Iss. 6, 2010-11 ,pp. :