Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.186, Iss.1, 2009-09, pp. : 136-138
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
X-ray Microscopy and Microtomography
By Chapman Henry Kirz Janos Stampanoni Marco
Synchrotron Radiation News, Vol. 26, Iss. 2, 2013-03 ,pp. :
PHOTOELECTRON X-RAY MICROSCOPY
Le Journal de Physique Colloques, Vol. 45, Iss. C2, 1984-02 ,pp. :
Trends in X-ray Fluorescence Microscopy
By Vogt Stefan Lanzirotti Antonio
Synchrotron Radiation News, Vol. 26, Iss. 2, 2013-03 ,pp. :