Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.191, Iss.1, 2009-11, pp. : 74-78
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Focused-ion-beam fabricated charge density wave devices
Le Journal de Physique IV, Vol. 12, Iss. 9, 2002-11 ,pp. :
Properties of SFS heterostructures prepared by a focused-ion-beam technique
Journal of Physics: Conference Series , Vol. 356, Iss. 1, 2012-03 ,pp. :