Evaluation of thermal parameters of layers and interfaces in silicon-on-diamond structures by a photothermal method

ISSN： 1742-6596

Source： Journal of Physics: Conference Series , Vol.214, Iss.1, 2010-03, pp. : 512-516

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Investigations of the optical and thermal parameters of porous silicon layers with the two wavelength photoacoustic method

Le Journal de Physique IV, Vol. 129, Iss. issue, 2005-10 ,pp. : 241-243

Edp Sciences

Access to resources Recommend Favorite

Characterization of materials and structures by the photothermal method

Le Journal de Physique IV, Vol. 04, Iss. C7, 1994-07 ,pp. : C7-287-C7-290

Edp Sciences

Access to resources Recommend Favorite

A Novel Comparative Photothermal Method for Measuring Thermal Diffusivity

By Broussely M. Levick A. Edwards G.

International Journal of Thermophysics, Vol. 26, Iss. 1, 2005-01 ,pp. : 221-232

Springer Publishing Company

Access to resources Recommend Favorite

Thermal characterization of high temperature reactor particle layers by photothermal microscopy

Journal of Physics: Conference Series , Vol. 214, Iss. 1, 2010-03 ,pp. : 630-634

IOP Publishing

Access to resources Recommend Favorite

An open-shell method for neutral vacancy in silicon and diamond

By Moliver S.

Physics of the Solid State, Vol. 42, Iss. 4, 2000-04 ,pp. : 673-682

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite