Temperature-dependent thermal characterization of Ge2Sb2Te5 and related interfaces by the photothermal radiometry technique
Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.214, Iss.1, 2010-03, pp. : 483-486
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Investigations on phase change characteristics of Ti-doped Ge2Sb2Te5 system
Journal of Physics D: Applied Physics, Vol. 48, Iss. 47, 2015-12 ,pp. :