Publisher： IOP Publishing
ISSN： 1742-6596
Source： Journal of Physics: Conference Series , Vol.214, Iss.1, 2010-03, pp. : 11-16
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Advances in photothermal depth profiling
Le Journal de Physique IV, Vol. 125, Iss. issue, 2005-06 ,pp. :
Access to resources
Recommend
Investigation of thermal properties of SiC using photothermal method
Le Journal de Physique IV, Vol. 137, Iss. issue, 2006-11 ,pp. :
Depth dependent local structures in CoPt thin films
Journal of Physics: Conference Series , Vol. 190, Iss. 1, 2009-11 ,pp. :
Access to resources
Local magnetic properties in amorphous magnetic wires
Journal of Physics: Conference Series , Vol. 200, Iss. 11, 2010-01 ,pp. :