Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.269, Iss.1, 2011-01, pp. : 139-147
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Fidelity amplitude of the scattering matrix in microwave cavities
New Journal of Physics, Vol. 7, Iss. 1, 2005-06 ,pp. :
Photothermal characterization of solid two-layer spherical structures
Journal of Physics: Conference Series , Vol. 214, Iss. 1, 2010-03 ,pp. :