Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.262, Iss.1, 2011-01, pp. : 256-261
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Probing the defects in nano-semiconductors using positrons
Journal of Physics: Conference Series , Vol. 265, Iss. 1, 2011-01 ,pp. :
Engineering Genetically Encoded FRET Sensors
By Lindenburg Laurens Merkx Maarten
Sensors, Vol. 14, Iss. 7, 2014-07 ,pp. :
Bridging the scales in nano engineering and science
By Fish Jacob
Journal of Nanoparticle Research, Vol. 8, Iss. 5, 2006-10 ,pp. :
Applications of Nuclear Magnetic Resonance Sensors to Cultural Heritage
By Proietti Noemi Capitani Donatella Di Tullio Valeria
Sensors, Vol. 14, Iss. 4, 2014-04 ,pp. :