Interface trap generation in MOS structures by high-energy electron irradiation

ISSN： 1742-6596

Source： Journal of Physics: Conference Series , Vol.253, Iss.1, 2010-11, pp. : 345-349

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

High energy electron-beam irradiation effects in Si-SiO_x structures

Journal of Physics: Conference Series , Vol. 682, Iss. 1, 2016-02 ,pp. : 95-102

IOP Publishing

Access to resources Recommend Favorite

Enhancement of high-energy electron generation through suppression of Raman backscattering

EPL (EUROPHYSICS LETTERS), Vol. 66, Iss. 4, 2004-05 ,pp. : 492-498

Edp Sciences

Access to resources Recommend Favorite

High-energy electron cooling in a collider

New Journal of Physics, Vol. 8, Iss. 11, 2006-11 ,pp. : 9-353

IOP Publishing

Access to resources Recommend Favorite

Effect of a high-energy proton-irradiation dose on the electron mobility in n -Si crystals

By Pagava T. Maisuradze N. Beridze M.

Semiconductors, Vol. 45, Iss. 5, 2011-05 ,pp. : 572-576

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

High-energy ion generation by short laser pulses

By Maksimchuk A. Flippo K. Krause H. Mourou G. Nemoto K. Shultz D. Umstadter D. Vane R. Bychenkov V. Dudnikova G. Kovalev V. Mima K. Novikov V. Sentoku Y. Tolokonnikov S.

Plasma Physics Reports, Vol. 30, Iss. 6, 2004-06 ,pp. : 473-495

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite