High-resolution SEM observation at the atomic level using a dedicated STEM with aberration correction

Publisher： IOP Publishing

ISSN： 1742-6596

Source： Journal of Physics: Conference Series , Vol.371, Iss.1, 2012-07, pp. : 43-46

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

The application of spherical aberration correction and focal series restoration to high-resolution images of platinum nanocatalyst particles

By  

Journal of Physics: Conference Series , Vol. 26, Iss. 1, 2006-02 ,pp. : 25-28

IOP Publishing

Access to resources Recommend Favorite

Using High-Resolution Airborne Data to Evaluate MERIS Atmospheric Correction and Intra-Pixel Variability in Nearshore Turbid Waters

By Larnicol Morgane   Launeau Patrick   Gernez Pierre  

Remote Sensing, Vol. 10, Iss. 2, 2018-02 ,pp. : 274-274

MDPI

Access to resources Recommend Favorite

Geo-Correction of High-Resolution Imagery Using Fast Template Matching on a GPU in Emergency Mapping Contexts

By Lemoine Guido   Giovalli Martina  

Remote Sensing, Vol. 5, Iss. 9, 2013-09 ,pp. : 4488-4502

MDPI

Access to resources Recommend Favorite

Application of 80-200 kV aberration corrected dedicated STEM with cold FEG

By  

Journal of Physics: Conference Series , Vol. 241, Iss. 1, 2010-07 ,pp. : 53-56

IOP Publishing

Access to resources Recommend Favorite