Publisher： IOP Publishing
ISSN： 1757-899X
Source： IOP Conference Series: Materials Science and Engineering, Vol.58, Iss.1, 2014-06, pp. : 2-4
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
IOP Conference Series: Materials Science and Engineering, Vol. 83, Iss. 1, 2015-05 ,pp. :
Access to resources
Recommend
IOP Conference Series: Materials Science and Engineering, Vol. 37, Iss. 1, 2012-07 ,pp. :
Electrical Characterization of As-Processed Semiconductor Surfaces - Invited Paper
Solid State Phenomena, Vol. 2016, Iss. 255, 2016-10 ,pp. :
Access to resources
Applications for Surface Engineering Using Atomic Layer Etching - Invited Paper
Solid State Phenomena, Vol. 2016, Iss. 255, 2016-10 ,pp. :
Extended-Nanofluidic Devices and the Unique Liquid Properties - Invited Paper
Solid State Phenomena, Vol. 2016, Iss. 255, 2016-10 ,pp. :