Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.146, Iss.1, 2009-01, pp. : 222-227
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Le Journal de Physique IV, Vol. 125, Iss. issue, 2005-06 ,pp. :
A COMBINED FIELD ELECTRON AND FIELD ION MICROSCOPE
Le Journal de Physique Colloques, Vol. 45, Iss. C9, 1984-12 ,pp. :
On the thermodynamics of contact interaction in an atomic force microscope
Technical Physics, Vol. 46, Iss. 10, 2001-10 ,pp. :
COMBINED FIELD ION AND SCANNING TUNNELING MICROSCOPE
Le Journal de Physique Colloques, Vol. 48, Iss. C6, 1987-11 ,pp. :
Near-field scanning microscope with carbon nanotube probe
By Kolerov A.
Technical Physics Letters, Vol. 37, Iss. 3, 2011-03 ,pp. :