Precision measurement of a potential-profile tunable single-electron pump

Author: Bae Myung-Ho   Ahn Ye-Hwan   Seo Minky   Chung Yunchul   Fletcher J D   Giblin S P   Kataoka M   Kim Nam  

Publisher: IOP Publishing

E-ISSN: 1681-7575|52|2|195-200

ISSN: 0026-1394

Source: Metrologia, Vol.52, Iss.2, 2015-04, pp. : 195-200

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Abstract

We performed a precision measurement of the current from a single-parameter electron pump, where the potential-profile for a quantum dot was manipulated by multiple top-metal gates. In an optimally tuned condition, driven with a sinusoidal-waveform microwave at f = 0.95 GHz, B = 11 T, and T = 0.3 K, the relative deviation of the pump current from ef, δIp/ef ≡ (Ipef)/ef was measured to be (−0.92  ±  1.37) ppm. Our experiment reproduces the current quantisation accuracy of a previous measurement of a single-parameter pump, but in a device fabricated using very different geometry, thereby indicating that accurate single-parameter pumping is insensitive to device details.

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