Potentials and challenges of integration for complex metal oxides in CMOS devices and beyond

Publisher: IOP Publishing

E-ISSN: 1361-6463|48|6|63001-63025

ISSN: 0022-3727

Source: Journal of Physics D: Applied Physics, Vol.48, Iss.6, 2015-02, pp. : 63001-63025

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract