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Infrared Reflectivity Determination of Alloy Composition in Al x Ga 1-x As and In x Ga 1-x As Structures

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Phonon Confinement in SiC Nanocrystals: Comparison of the Size Determination Using Transmission Electron Microscopy and Raman Spectroscopy

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Photoreflectance spectroscopy of delta-doped GaAs layers

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