Defect reduction in GaAs/Si film with InAs quantum-dot dislocation filter grown by metalorganic chemical vapor deposition

Publisher: IOP Publishing

E-ISSN: 1741-4199|24|2|28101-28104

ISSN: 1674-1056

Source: Chinese Physics B, Vol.24, Iss.2, 2015-02, pp. : 28101-28104

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