Mild degradation processes in ZnO-based varistors: the role of Zn vacancies

Author: Ponce M.A.   Macchi C.   Schipani F.   Aldao C.M.   Somoza A.  

Publisher: Taylor & Francis Ltd

E-ISSN: 1478-6443|95|7|730-743

ISSN: 1478-6443

Source: Philosophical Magazine, Vol.95, Iss.7, 2015-03, pp. : 730-743

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Abstract