New insights into the role of the disordered WIP N‐terminal domain revealed by NMR structural characterization

Publisher: John Wiley & Sons Inc

E-ISSN: 1742-4658|282|4|700-714

ISSN: 1742-464x

Source: FEBS JOURNAL (ELECTRONIC), Vol.282, Iss.4, 2015-02, pp. : 700-714

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