Parallel confocal microscopy using high‐order axially symmetric polarized beams

Publisher: John Wiley & Sons Inc

E-ISSN: 1097-0029|78|4|302-308

ISSN: 1059-910x

Source: MICROSCOPY RESEARCH AND TECHNIQUE, Vol.78, Iss.4, 2015-04, pp. : 302-308

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Abstract