Extraction of hidden information of ToF‐SIMS data using different multivariate analyses

Publisher: John Wiley & Sons Inc

E-ISSN: 1096-9918|47|4|439-446

ISSN: 0142-2421

Source: SURFACE AND INTERFACE ANALYSIS, Vol.47, Iss.4, 2015-04, pp. : 439-446

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Abstract