Investigation of phases and textures of binary V-Si coating deposited on vanadium-based alloy (V-4Cr-4Ti) using electron backscatter diffraction

Publisher： IOP Publishing

E-ISSN： 1757-899X|82|1|275-279

ISSN： 1757-899X

Source： IOP Conference Series: Materials Science and Engineering, Vol.82, Iss.1, 2015-04, pp. : 275-279

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