Diameter-dependent annealing kinetics of X-ray-induced defects in single-walled carbon nanotubes

Publisher: IOP Publishing

E-ISSN: 1757-899X|80|1|82-85

ISSN: 1757-899X

Source: IOP Conference Series: Materials Science and Engineering, Vol.80, Iss.1, 2015-04, pp. : 82-85

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Abstract